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    PCIe 3.1 SerDes PHY IP

    OverviewFeaturesRequest Datasheet

    This Peripheral Component Interconnect Express (PCIe) x4 PHY IP supports PCIe3.1 transmission. This is compliant with PCIe Rev3 Base Specification with support of PIPE 4.3 interface spec. Input clock frequency as 25Mhz, the output data rate(serial) supports all three 2.5 Gbps, 5.0 Gbps, 8.0 Gbps. 10 Pads is required and the max clock speed is 500MHz.

    Operating Voltage Range : - 0.99V-1.21V, typical=1.1V - 2.97V-3.63V,typical=3.3V

    The PHY is Silicon Proven and in Production in various applications.

    t2m-design-reuse t2m-chipestimate t2m-anysilicon

    • Support PHY interface (PIPE4.3) enables multiple IP sources for USB3 MAC layer
    • Supports 5.0Gbps and 10Gbps serial data transmission rate Supports 16-bit or 32-bit parallel interface Data and clock recovery from serial stream
    • Support 8b/10b encoder/decoder(5Gbps), 128/130 encoder/decoder(BGbps) and error indication
    • Tunable receiver detection to detect worse case cables
    • Beacon transmission and reception
    • Support SSCG function to reduce EMI effects with tunable down-spread amplitude
    • Selectable TX margining, TX de-emphasis and signal swing values
    • Built-in-self-test with internal Loopback test option
    • Programmable analog circuit parameter adjustment and internal test control
    • Compliant with PCIe Rev3 base specification
    • Silicon Proven in  TSMC 28HPC+
    • Silicon Proven in TSMC 40LP
    • Low Area
    • Low Power
    • Compliant with PCIe® 3.1, 2.1, 1.1, and PIPE specifications
    • PCIe PHY functionality is fully verified
    • Notebooks
    • Smartphones
    • Tablets
    • Embedded mobile computing
    • Ultraportable laptops
    • Automotive
    • Mobile multimedia
    • Digital home
    • Digital office
    • Wireless connectivity
    • Application Note / User Manual
    • Behavior model, and protected RTL codes
    • Protected Post layout netlist and Standard Delay Format (SDF)
    • Synopsys library (LIB)
    • Frame view (LEF)
    • Metal GDS (GDSII)
    • Test patterns and Test Documentation

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