Production Proven, Complex Semiconductor IP Cores

Semiconductor IP Cores


T2M USB USB 3.1 Type-C PHY IP in 55SP/EF

USB 3.1 Type-C PHY IP in 55SP/EF

Description and Features

A high performance, high-speed SERDES IP called USB3.1Type-C PHY is created for semiconductors that provide high bandwidth data connection while using less power. A specific design for USB 3.1 type-C applications is the USB 3.1Type-C PHY IP. A dedicated PCS can be provided together with the USB 3.1 Type C PHY IP to complete functionality of various applications, including elastic buffer, scramble/de-scramble, data encoding/decoding, PRBS generation/checking, registers control and testing. Depending on the customer's choice, PCS is offered as either a hard or soft macro; additionally, the PCS specification will be made available separately. Using a test bench constructed in Verilog HDL, the NC-Verilog simulation software verifies PHY functionality.

 

Features
  • Support half rate mode (5Gbps) and full rate mode (10Gbps)
  • Tolerate max +/-7000ppm input frequency offset
  • 32bit/40bit selectable parallel data bus
  • Programmable transmit amplitude
  • 3 taps/2 taps selectable FFE
  • Receiver CTLE and One-tap perspective DFE
  • Build in self-test with PRBS7/31 pattern generation and checker for production test
  • Integrated on-die termination resistors
  • Support receiver detection
  • Support LFPS signal generation and detection
  • Support Spread Spectrum clock generation and receiving
  • Flexible reference clock frequency
  • Do not need any external component
  • ESD: HBM/MM/CDM/Latch Up2000V/200V/500V/100mA
  • Metal Layer:M1~M7+RDL
  • Core Voltage: 1.1V
  • IO Voltage: 3.3V
  • Silicon Proven in UMC 55SP/EF.

Deliverables

  • Graphic Data System II File Including Layer Mapping .

  • LEF Files Depicting Placement and Routing Topology

  • Timing and Power Characterization Data in Liberty Format

  • Verilog Model Depicting Functional Behavior

  • Standard Delay Format Timing Specifications for Circuit Netlist

  • Application Notes Offering Layout Best Practices

  • LVS and DRC Verification Results Summary